Searching for diagnostic features for controlled surfaces contamination recognition system at the optoelectronic monitoring
DOI: 10.34759/trd-2020-112-018
Аuthors
1*, 1*, 1*, 21. Mlitary spaсe Aсademy named after A.F. Mozhaisky, Saint Petersburg, Russia
2. Baltic State Technical University “VOENMEH ” named after D.F. Ustinov, 1, 1st Krasnoarmeyskaya str., Saint Petersburg, 190005, Russia
*e-mail: vka@mil.ru
Keywords:
quality control, artificial intelligence, pattern recognition, dictionary of signs, controlled surface, light intensityReferences
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