Methodology for estimating the efficiency of optical-electronic systems using an analytical model. Noise model of the «Oes-operator» system


DOI: 10.34759/trd-2022-122-22

Аuthors

Krasnov A. M.1*, Tregubenkov S. Y.2, Rumyantsev A. V.2, Khismatov R. F.3, Shashkov S. N.3

1. Closed Joint Stock Company «Technological Park of Cosmonautics «LINKOS»», Moscow, Shcherbinka, Russia
2. Military Representation of the Ministry of Defense of the Russian Federation, Moscow, Russia
3. Ramenskoye Instrument-Making Plant, 39, Mikhalevich str., Ramenskoe, Moscow Region, 140100, Russia

*e-mail: a_krasnov@inbox.ru

Abstract

Efficiency assessment is an integral part of optoelectronic systems (OES) development stages, testing and operation. The lack of a unified technique for optoelectronic systems effectiveness assessing leads to the fact that various assessment methods are employed to compare different systems, which results in obtaining contradictory results that do not provide objective data for making appropriate decisions at various stages of optoelectronic systems life cycle. One of the ways to this problem solving consists in an analytical model developing, which will represent the basis for creating the unified complex of means for intellectual support for optoelectronic systems design and maintenance at all stages of the lifecycle.

The purpose of the presented article consists in describing an analytical model for the optoelectronic systems effectiveness assessing, in a part concerning the noise model of the “OES-operator” system.

The following noise components of the “OES-operator” system are considered: the noise variance of the visual system of the OES operator, and the noise variance displayed on the OES display. The article presents the formula dependences of the noise variance components displayed on the OES display. These are the spectral density of the noise on the display, the temporal noise bandwidth and the spatial noise bandwidth. A model for computing the temperature difference equivalent to the noise was considered.

Further, the article presents the example of the initial data presentation in the analytical model for optoelectronic systems effectiveness assessing, and the results of the noise impact assessment on such OES efficiency indicators as detection range, recognition and identification of an object.

The considered noise model of the “OES-operator” system as an integral part of the analytical model for optoelectronic systems effectiveness assessing is a tool for an objective assessment of the of the optoelectronic systems sensitivity, which excludes the subjective opinion caused by the human factor.

It is advisable to employ this noise model of the “OES-operator” system in the development of tactical and technical requirements for optoelectronic systems, and optoelectronic systems themselves at the preliminary and technical design stages.

Computing temperature difference equivalent to the noise allows performing assessment:

- Of noise components impact on the values of detection range, recognition and identification of the object to the specified tactical-and-technical requirements at the stage products testing;

- Of the OES radiation receiver sensitivity for this parameter compliance with the values indicated in the specified in operational documentation at the stages of mass production and operation.

Thus, the noise model of the “OES-operator” system implementation, which is an constituent part of a single software package for intelligent support of design and maintenance of optoelectronic systems at all stages of the life cycle, was considered.

Keywords:

electro-optical imaging system, spatial noise, temporal noise, detection, recognition, identification

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