Comparative analysis of test systems for FPGAS and their environment

DOI: 10.34759/trd-2022-125-22

Аuthors

Brekhov O. M.^*, Ratnikov M. O.^**

Moscow Aviation Institute (National Research University), 4, Volokolamskoe shosse, Moscow, А-80, GSP-3, 125993, Russia

*e-mail: obrekhov@mail.ru
**e-mail: m.o.ratnikov@mail.ru

Abstract

This work is devoted to the study and analysis of currently used FPGA test systems and their system environment, developed by both domestic and foreign researchers. More than 30 test systems based on the use of: built-in self-test structures (BIST), specially designed systems and systems that partially or completely use the target firmware are considered. The systems in question were used to solve various tasks: FPGA input control, testing of internal interconnection resources, testing of individual cells and embedded IP cores, testing of the FPGA system environment (external connections of FPGAs and the power subsystem), analysis of electrical, dynamic and functional characteristics in various conditions, search for single failures and failures. The systems used in the study of microcircuits for resistance to laser exposure, the flow of charged particles (including studies within the Alice CERN project and studies conducted by both FPGA suppliers and third-party researchers to compare the characteristics of various FPGAs), the accumulated dose of radiation, elevated temperature and changes in supply voltage are considered. The systems and methods that are used to debug the FPGA-based system are also considered. Also in the list of test systems considered there are systems used as a demonstrator of the application of methods for analyzing energy consumption, dynamic characteristics, reliability and fault tolerance, as well as testing and developing systems based on FPGAs. The result of the work is a classification of the considered systems, an analysis of the advantages and disadvantages of the considered systems and proposals for the further development of FPGA test systems and their system environment.

Keywords:

ASIC, FPGA, testing, test system, fault tolerance

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